Year: 2009
Book Chapters
2009
[1] , , and : Value-Based Requirements Traceability: Lessons Learned, Chapter in (Kalle Lyytinen, Pericles Loucopoulos, John Mylopoulos, Bill Robinson, eds.), Springer Berlin Heidelberg, volume 14, . [pdf] [doi]
Refereed Journal Papers and Articles
2009
[3] , and : An Efficient and Scalable Approach to Correct Class Model Refinement., in IEEE Transactions on Software Engineeering, volume 35, . [pdf]
[2] , , , , and : Exploring how to use scenarios to discover requirements, in Requirements Engineering, volume 14, . [doi]
[1] and : Guest editors' introduction., in Journal of Automated Software Engineering, volume 16, . [pdf] [doi]
Refereed Conference Papers
2009
[6] , and : Development and adaptation of IEC 61499 automation and control applications with runtime variability models, in Proceedings 7th IEEE Int'l Conference on Industrial Informatics (INDIN 2009), . [doi]
[5] , , and : Flexibility and End-User Support in Model-Based Product Line Tools, in Proceedings 35th Euromicro Conference on Software Engineering and Advanced Applications, SEAA 2009, Patras, Greece, August 27-29, IEEE Computer Society, . [doi]
[4] , , and : Model-Based Customization and Deployment of Eclipse-Based Tools: Industrial Experiences, in Proceedings 24th IEEE/ACM Int'l Conference on Automated Software Engineering, Auckland, New Zealand, November 16-20 (ASE 2009), IEEE Computer Society, . [doi]
[3] , , and : Scenarios in the Wild: Experiences with a Contextual Requirements Discovery Method, in Proceedings 15th Int'l Working Conference Requirements Engineering: Foundation for Software Quality (REFSQ 2009), Amsterdam, The Netherlands, June 8-9 (Martin Glinz, Patrick Heymans, eds.), Springer, volume 5512, . [doi]
[2] and : Selective backtracking of model changes., in 31st International Conference on Software Engineering (ICSE), May 2009, Vancouver, Canada, . [pdf] [doi]
[1] , and : Three-Level Customization of Software Products Using a Product Line Approach, in Proceedings 42st Hawaii Int'l Int'l Conference on Systems Science (HICSS-42 2009), Proceedings (CD-ROM and online), 5-8 January, Waikoloa, Big Island, HI, USA, IEEE Computer Society, . [doi]
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