by Alexander Egyed
Abstract:
Software development artifacts-such as model descriptions, diagrammatic languages, abstract (formal) specifications, and source code-are highly interrelated where changes in some of them affect others. Trace dependencies characterize such relationships abstractly. This paper presents an automated approach to generating and validating trace dependencies. It addresses the severe problem that the absence of trace information or the uncertainty of its correctness limits the usefulness of software models during software development. It also automates what is normally a time consuming and costly activity due to the quadratic explosion of potential trace dependencies between development artifacts.
Reference:
A Scenario-Driven Approach to Trace Dependency Analysis. (Alexander Egyed), In IEEE Transactions on Software Engineering, volume 29, 2003.
Bibtex Entry:
@Article{dblp:journals/tse/Egyed03,
author = {Alexander Egyed},
title = {A Scenario-Driven Approach to Trace Dependency Analysis.},
journal = {IEEE Transactions on Software Engineering},
year = {2003},
volume = {29},
number = {2},
pages = {116-132},
abstract = {Software development artifacts-such as model descriptions, diagrammatic
languages, abstract (formal) specifications, and source code-are
highly interrelated where changes in some of them affect others.
Trace dependencies characterize such relationships abstractly. This
paper presents an automated approach to generating and validating
trace dependencies. It addresses the severe problem that the absence
of trace information or the uncertainty of its correctness limits
the usefulness of software models during software development. It
also automates what is normally a time consuming and costly activity
due to the quadratic explosion of potential trace dependencies between
development artifacts.},
file = {:Journals\\TSE 2003 - A Scenario-Driven Approach to Trace Dependency Analysis\\A Scenario-Driven Approach to Trace Dependency Analysis-preprint.pdf:PDF},
keywords = {},
url = {http://doi.ieeecomputersociety.org/10.1109/TSE.2003.1178051},
}